发明名称 |
In-circuit test adaptors, includes double sleeve with optimal test spring contacts through which the test terminals of a PCB is directly connected to a test system |
摘要 |
A printed circuit board has its test terminals directly connected to a test system via the optimal test spring contacts of a double sleeve. The PCB is prefabricated with a copper layer on which the test terminals are strategically formed.
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申请公布号 |
DE10016453(A1) |
申请公布日期 |
2001.11.15 |
申请号 |
DE20001016453 |
申请日期 |
2000.04.01 |
申请人 |
BOCTOR, GRANT;RATZKY, BRUNO |
发明人 |
BOCTOR, GRANT;RATZKY, BRUNO |
分类号 |
G01R1/04;G01R1/073;G01R31/317;G01R31/319;(IPC1-7):G01R31/28;G01R31/26 |
主分类号 |
G01R1/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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