发明名称 SEMICONDUCTOR MANUFACTURING SYSTEM AND CONTROL METHOD THEREOF
摘要 <p>In a semiconductor manufacturing system, operations of a plurality of processing apparatuses are controlled to efficiently manufacture semiconductor devices. The semiconductor manufacturing system has a memory part and a control part. The memory part (5) stores priority-level data indicating a priority level of the process to be applied to each of the semiconductor substrates on an individual semiconductor substrate basis. The control part (3, 7) controls the processing apparatus to apply the process to a newly supplied semiconductor substrates by determining process order, based on a comparison of the new priority-level data of the newly supplied one with priority-level data with respect to the originally scheduled process of the semiconductor substrates.</p>
申请公布号 WO0186704(A1) 申请公布日期 2001.11.15
申请号 WO2001JP03846 申请日期 2001.05.08
申请人 TOKYO ELECTRON LIMITED;KARASAWA, WATARU 发明人 KARASAWA, WATARU
分类号 H01L21/02;G05B19/418;(IPC1-7):H01L21/02 主分类号 H01L21/02
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