发明名称 METHOD AND APPARATUS FOR PLASMA PROCESSING
摘要 <p>A temperature-adjusting means is buried in an upper portion of a ring member which surrounds a stage for a semiconductor wafer and has the same height as the stage. The temperature-adjusting means is controlled by the ring-member temperature controller 61, according to a recipe for setting a process condition, in such a manner that temperatures of a surface of the wafer and of an upper surface of the ring member are even, respectively. At that time, a temperature difference between above the wafer and above the upper surface of the ring member is made small, which enables to form a film having a higher uniformity. &lt;IMAGE&gt;</p>
申请公布号 EP1154466(A1) 申请公布日期 2001.11.14
申请号 EP20000901898 申请日期 2000.01.26
申请人 TOKYO ELECTRON LIMITED 发明人 AMANO, HIDEAKI;ISHIZUKA, SHUICHI;KOBAYASHI, TAKASHI;TSUBOI, KYO
分类号 C23C16/458;C23C16/46;C23C16/50;C23C16/511;H01J37/32;H01L21/00;(IPC1-7):H01L21/205 主分类号 C23C16/458
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