发明名称 Frequency measurement test circuit and semiconductor integrated circuit having the same
摘要 A frequency measurement test circuit includes a frequency divider, and a detection circuit. The frequency divider frequency-divides an input to be measured. The detection circuit outputs a signal of level set on the basis of a relationship in magnitude between the frequency of the signal frequency-divided by the frequency divider and that of a reference clock signal.
申请公布号 US6316929(B1) 申请公布日期 2001.11.13
申请号 US20000492233 申请日期 2000.01.27
申请人 NEC CORPORATION 发明人 YAMAGUCHI MICHIMASA
分类号 G01R23/10;G01R23/15;G01R31/28;(IPC1-7):G01R23/12;G01R27/00;H03B19/00 主分类号 G01R23/10
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