发明名称 Active reticle, method for making same, ion projecting lithography method using same and equipment therefor
摘要 The invention concerns a method for producing highly dependable ion projecting lithography, from single or multiple charge ions which consists in causing a selective interaction by applying a voltage difference between an absorbent layer and a reflecting layer of the reticle. In one embodiment, the active reticle (1) comprises a solid substrate (100), a conductive layer (101) etched with patterns (10) corresponding to the micronic patterns to be printed. The patterns comprise a core (11) made of conductive material connected to the positive terminal (A) of an electric supply (110), the conductive layer (101) being connected to the other terminal (B), the core (11) of the patterns being insulated from the conductive layer (101) by a layer (12). A voltage difference is applied between the two terminals (A, B) so that the incident ions (I1, I2) are selectively neutralised and back-scattered as they approach the reticle (1).
申请公布号 AU4845701(A) 申请公布日期 2001.11.07
申请号 AU20010048457 申请日期 2001.04.24
申请人 X-ION 发明人 JEAN-PIERRE LAZZARI;VINCENT LE ROUX
分类号 G03F1/00;G03F7/20;H01J37/317 主分类号 G03F1/00
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