发明名称 Charged particle irradiation apparatus and operating method thereof
摘要 <p>A charged particle irradiation apparatus, which is capable of decreasing a lateral dose falloff at boundaries of irradiation field of charged particle beam, and reducing the size of the charged particle irradiation apparatus, is provided by controlling magnetic fields of quadrupole electromagnets 1-5 and deflection electromagnets 6-8 so that center of the charged particle beam passes always center of a scatterer irrespective of direction and intensity of a magnetic field generated by scanning electromagnets 50, 60. &lt;IMAGE&gt;</p>
申请公布号 EP1152436(A2) 申请公布日期 2001.11.07
申请号 EP20010115220 申请日期 1998.01.30
申请人 HITACHI, LTD. 发明人 AKIYAMA, HIROSHI;HIRAMOTO, KAZUO;MATSUDA, KOJI;NORIMINE, TETSURO
分类号 G21K1/093;A61N5/10;G21K5/04;G21K5/10;H01J37/21;(IPC1-7):G21K5/10 主分类号 G21K1/093
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