发明名称 METHOD FOR FORMING PASSIVATION PATTERN OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A passivation pattern formation method is provided to easily remove polymer residues existed on a nitride pattern, thereby minimizing a damage of a metal pattern. CONSTITUTION: A passivation pattern(34a) having a window(35) for connecting between a connector wire and a metal pattern(32) is formed on a semiconductor substrate(30) having the metal pattern(32). A nitride layer is formed on the passivation pattern(34a), at inner of the window(35) and on the exposed metal pattern. A nitride spacer(36a) is formed at both sidewalls of the window(35) by etch-back of the nitride layer. Then, polymer residues generated at the etch-back process are entirely removed by cleaning the nitride spacer(36a) using an organic cleaning solution.
申请公布号 KR20010095587(A) 申请公布日期 2001.11.07
申请号 KR20000018843 申请日期 2000.04.11
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, GYEONG JU
分类号 H01L21/318;(IPC1-7):H01L21/318 主分类号 H01L21/318
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