发明名称 |
METHOD FOR FORMING PASSIVATION PATTERN OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A passivation pattern formation method is provided to easily remove polymer residues existed on a nitride pattern, thereby minimizing a damage of a metal pattern. CONSTITUTION: A passivation pattern(34a) having a window(35) for connecting between a connector wire and a metal pattern(32) is formed on a semiconductor substrate(30) having the metal pattern(32). A nitride layer is formed on the passivation pattern(34a), at inner of the window(35) and on the exposed metal pattern. A nitride spacer(36a) is formed at both sidewalls of the window(35) by etch-back of the nitride layer. Then, polymer residues generated at the etch-back process are entirely removed by cleaning the nitride spacer(36a) using an organic cleaning solution.
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申请公布号 |
KR20010095587(A) |
申请公布日期 |
2001.11.07 |
申请号 |
KR20000018843 |
申请日期 |
2000.04.11 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, GYEONG JU |
分类号 |
H01L21/318;(IPC1-7):H01L21/318 |
主分类号 |
H01L21/318 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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