| 摘要 |
An electrical circuit for measuring threshold voltages and also a circuit for controlling threshold value variations, while avoiding a need to significantly modify or alter the circuit layout, are provided. A semiconductor device has a plurality of substrate conductor regions commonly shared by multiple metal insulator semiconductor field effect transistors (MISFETs) of the same conductivity type, wherein each of the plurality of substrate conductor regions is electrically separated or isolated from one another.
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