发明名称 Semiconductor device with partial passivation layer
摘要 A semiconductor device includes a first dielectric layer, a plurality of conductive interconnections formed in the first dielectric layer, a patterned passivation layer formed above the conductive interconnections, and a second dielectric layer formed above and in contact with the passivation layer and the first dielectric layer. A method for forming a semiconductor device includes providing a base layer, forming a first dielectric layer over the base layer, forming a plurality of conductive interconnections in the first dielectric layer, forming a patterned passivation layer above the conductive interconnections, and forming a second dielectric layer above and in contact with the passivation layer and the first dielectric layer.
申请公布号 US6313538(B1) 申请公布日期 2001.11.06
申请号 US20000489479 申请日期 2000.01.21
申请人 ADVANCED MICRO DEVICES, INC. 发明人 ZISTL CHRISTIAN;BESSER PAUL R.;APELGREN ERIC M.;KEPLER NICHOLAS J.;DAKSHINA-MURTHY SRIKANTESWARA
分类号 H01L21/768;H01L23/31;H01L23/532;(IPC1-7):H01L23/48 主分类号 H01L21/768
代理机构 代理人
主权项
地址