发明名称 Chemical vapor deposition using organometallic precursors
摘要 A multi-component layer is deposited on a semiconductor substrate in a semiconductor process. The multi-component layer may be a dielectric layer formed from a gaseous titanium organometallic precursor, reactive silane-based gas and a gaseous oxidant. The multi-component layer may be deposited in a cold wall or hot wall chemical vapor deposition (CVD) reactor, and in the presence or absence of plasma. The multi-component layer may also be deposited using other processes, such as radiant energy or rapid thermal CVD.
申请公布号 US6313035(B1) 申请公布日期 2001.11.06
申请号 US19960660059 申请日期 1996.05.31
申请人 MICRON TECHNOLOGY, INC. 发明人 SANDHU GURTEJ S.;FAZAN PIERRE
分类号 C23C16/40;H01L21/316;H01L21/8242;(IPC1-7):H01L21/44;H01L21/824 主分类号 C23C16/40
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