发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device which can be increased in a bonding quality and reliability while suppressed with the increase in manufacturing cost, and also provide a method of manufacturing the same. SOLUTION: This is a method of manufacturing a semiconductor device which comprises an interconnection and an electrode pad 1 formed of an Al alloy film formed at one end of the interconnection, This method comprises a process of forming the interconnection and the electrode pad 1 on an insulation film 3, and a process of implanting Ar ions 9 into the electrode pad 1 to improve the wettability of the electrode pad 1, The electrode pad 1 is used to bond an Au wire to.
申请公布号 JP2001308138(A) 申请公布日期 2001.11.02
申请号 JP20000126032 申请日期 2000.04.26
申请人 SEIKO EPSON CORP 发明人 SHINDO AKINORI
分类号 H01L23/52;H01L21/3205;H01L21/60 主分类号 H01L23/52
代理机构 代理人
主权项
地址