发明名称 |
METHOD OF FORMING POLYCRYSTALLINE SEMICONDUCTOR FILM, DEVICE FOR FORMING THE SAME, AND METHOD OF MANUFACTURING POLYCRYSTALLINE SEMICONDUCTOR THIN-FILM TRANSISTOR |
摘要 |
PROBLEM TO BE SOLVED: To prevent a TFT against deterioration in characteristics, such as a variation in a threshold voltage, a reduction in an on-state current and others due to the effects of impurities taken into a polycrystalline semiconductor film. SOLUTION: The uppermost surface of an amorphous silicon film 3 is etched through a reverse sputtering treatment, and the amorphous silicon film 3 is crystallized by excimer laser annealing.
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申请公布号 |
JP2001308007(A) |
申请公布日期 |
2001.11.02 |
申请号 |
JP20000120768 |
申请日期 |
2000.04.21 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
IKUTA SHIGEO |
分类号 |
H01L21/20;H01L21/336;H01L29/786;(IPC1-7):H01L21/20 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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