发明名称 METHOD OF FORMING POLYCRYSTALLINE SEMICONDUCTOR FILM, DEVICE FOR FORMING THE SAME, AND METHOD OF MANUFACTURING POLYCRYSTALLINE SEMICONDUCTOR THIN-FILM TRANSISTOR
摘要 PROBLEM TO BE SOLVED: To prevent a TFT against deterioration in characteristics, such as a variation in a threshold voltage, a reduction in an on-state current and others due to the effects of impurities taken into a polycrystalline semiconductor film. SOLUTION: The uppermost surface of an amorphous silicon film 3 is etched through a reverse sputtering treatment, and the amorphous silicon film 3 is crystallized by excimer laser annealing.
申请公布号 JP2001308007(A) 申请公布日期 2001.11.02
申请号 JP20000120768 申请日期 2000.04.21
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 IKUTA SHIGEO
分类号 H01L21/20;H01L21/336;H01L29/786;(IPC1-7):H01L21/20 主分类号 H01L21/20
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