发明名称 |
FLATTENING METHOD OF SEMICONDUCTOR SUBSTRATE |
摘要 |
PROBLEM TO BE SOLVED: To provide a method wherein a step-difference of an underlying layer formed on a semiconductor substrate is easily and uniformly flattened without contaminating the semiconductor substrate. SOLUTION: In this flattening method of a semiconductor substrate, the underlying layer 2 having the step-difference 10 is formed on the semiconductor substrate 1. A film 3 for flattening the step-difference 10 is arranged on the underlying layer 2, an adhesive sheet 4 or the like is stuck on the film 3, and the film 3 is subjected to flattening work by peeling operation of the sheet 4.
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申请公布号 |
JP2001308177(A) |
申请公布日期 |
2001.11.02 |
申请号 |
JP20000122393 |
申请日期 |
2000.04.18 |
申请人 |
NITTO DENKO CORP;HITACHI LTD;HITACHI ULSI SYSTEMS CO LTD |
发明人 |
TERADA YOSHIO;NAMIKAWA AKIRA;TOYODA HIDESHI;TOKUNAGA TAKAFUMI;MAEKAWA ATSUSHI |
分类号 |
H01L21/768;H01L21/3205;H01L23/52;(IPC1-7):H01L21/768;H01L21/320 |
主分类号 |
H01L21/768 |
代理机构 |
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