发明名称 DEVICE AND METHOD FOR ETCHING TREATMENT
摘要 PROBLEM TO BE SOLVED: To provide a device and method for etching treatment which can suppress the contact between an etchant within a treatment vessel and a gas outside the treatment vessel, and can sharply reduce the concentration change of etchant. SOLUTION: The contact between the etchant within a treatment vessel and the gas outside the treatment vessel is suppressed, by supplying inert gas to the vicinity of the opening within the treatment vessel, thereby forming a gas curtain in the inert gas atmosphere or in the vicinity of liquid level, when covers 6A, 6B, 6C, 6D, 6E, and 6F shift from close positions to open positions, to open an opening 1a of the treatment vessel 1.
申请公布号 JP2001308062(A) 申请公布日期 2001.11.02
申请号 JP20000125965 申请日期 2000.04.26
申请人 TOHO KASEI KK 发明人 MAEDA TOKUO;NOGUCHI HIDEO;TAKEMURA SADAO
分类号 C23F1/08;H01L21/306;(IPC1-7):H01L21/306 主分类号 C23F1/08
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