| 摘要 |
PROBLEM TO BE SOLVED: To resolve problems of the conventional test method of a semiconductor integrated circuit, i.e., a long test time, a high test cost, and yield reduction by the generation of failures due to the test circuit itself. SOLUTION: Memory elements (MC1-MC4) are comprised, a plurality of variable logic cells (LCL) that can output any logical output corresponding to an input by means of the memory information of the memory elements are closely laid on the area except the circuit blocks (CPU, ROM) on a semiconductor chip, and this integrated circuit is constituted so as to test the circuit block in the chip by using this variable logic cell.
|
