发明名称 Method of manufacturing capacitor of semiconductor device
摘要 The present invention discloses a method of manufacturing a TaON capacitor having a high capacity comprising the steps of forming an intermediate insulating layer on a semiconductor substrate; forming a lower electrode on the intermediate insulating layer; depositing a TaON thin film in an amorphous state on the lower electrode; annealing the amorphous TaON thin film in a vacuum state to form a crystalline TaON thin film that will serve as a dielectric layer; and forming an upper electrode on the dielectric layer made of the TaON thin film.
申请公布号 US2001036703(A1) 申请公布日期 2001.11.01
申请号 US20000745426 申请日期 2000.12.26
申请人 LEE KEE JEUNG;YANG HONG SEON 发明人 LEE KEE JEUNG;YANG HONG SEON
分类号 H01L27/04;H01L21/02;H01L21/314;H01L21/316;H01L21/822;H01L21/8242;H01L27/108;(IPC1-7):H01L21/824;H01L21/20 主分类号 H01L27/04
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