发明名称 |
Method of manufacturing capacitor of semiconductor device |
摘要 |
The present invention discloses a method of manufacturing a TaON capacitor having a high capacity comprising the steps of forming an intermediate insulating layer on a semiconductor substrate; forming a lower electrode on the intermediate insulating layer; depositing a TaON thin film in an amorphous state on the lower electrode; annealing the amorphous TaON thin film in a vacuum state to form a crystalline TaON thin film that will serve as a dielectric layer; and forming an upper electrode on the dielectric layer made of the TaON thin film.
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申请公布号 |
US2001036703(A1) |
申请公布日期 |
2001.11.01 |
申请号 |
US20000745426 |
申请日期 |
2000.12.26 |
申请人 |
LEE KEE JEUNG;YANG HONG SEON |
发明人 |
LEE KEE JEUNG;YANG HONG SEON |
分类号 |
H01L27/04;H01L21/02;H01L21/314;H01L21/316;H01L21/822;H01L21/8242;H01L27/108;(IPC1-7):H01L21/824;H01L21/20 |
主分类号 |
H01L27/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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