发明名称 APPARATUS AND METHOD FOR CLEANING WAFER
摘要 PURPOSE: An apparatus and a method for cleaning a wafer are provided to improve cleaning capacity and etching uniformity by performing a cleaning process, a rinsing process, and a dry process within one bath. CONSTITUTION: A single chamber(100) performs all processes such as a cleaning process, a rinsing process, and a dry process. A wafer(101) is installed in the chamber(100). A chemical and DI(DeIonized) supply line(102a) supplies chemicals or DI to the chamber(100). A chemical and DI exhaust line(103a) exhausts the chemicals or DI. A chemical injection module(104) decides a mixing ratio of the injected chemicals. An IPA(IsoPropyl Alcohol) supply module(105) injects heated IPA to the chamber(100) in order to dry the wafer(101) after the cleaning process is completed. An IPA supply line(103a) supplies the IPA from the IPA supply module(105) to the chamber(100). An IPA exhaust portion(102b) exhausts the IPA after the dry process is completed.
申请公布号 KR20010094349(A) 申请公布日期 2001.11.01
申请号 KR20000016555 申请日期 2000.03.30
申请人 HYNIX SEMICONDUCTOR INC. 发明人 SUNG, GI CHEON
分类号 H01L21/304;(IPC1-7):H01L21/304 主分类号 H01L21/304
代理机构 代理人
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