发明名称 Crystalline semiconductor thin film, method of fabricating the same, semiconductor device and method of fabricating the same
摘要 There is provided a technique to form a single crystal semiconductor thin film or a substantially single crystal semiconductor thin film. An amorphous semiconductor thin film is irradiated with ultraviolet light or infrared light, to obtain a crystalline semiconductor thin film (102). Then, the crystalline semiconductor thin film (102) is subjected to a heat treatment at a temperature of 900 to 1200° C. in a reduced atmosphere. The surface of the crystalline semiconductor thin film is extremely flattened through this step, defects in crystal grains and crystal grain boundaries disappear, and the single crystal semiconductor thin film or substantially single crystal semiconductor thin film is obtained.
申请公布号 US2001036692(A1) 申请公布日期 2001.11.01
申请号 US20010894125 申请日期 2001.06.29
申请人 YAMAZAKI SHUNPEI;OHTANI HISASHI;TAKANO TAMAE 发明人 YAMAZAKI SHUNPEI;OHTANI HISASHI;TAKANO TAMAE
分类号 G02F1/1362;H01L21/02;H01L21/20;H01L21/324;H01L21/336;H01L21/77;H01L21/84;H01L27/12;H01L27/13;H01L29/786;(IPC1-7):H01L21/20;H01L21/00;C30B1/00;H01L21/36 主分类号 G02F1/1362
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