| 摘要 |
<p>A method and apparatus for testing a circuit by detecting radiation from the circuit. A circuit tester (10) comprises a signal source (20), a photodetector (30), and a decision circuit (40). The signal source (20) supplies the circuit (12) with an input signal having a test pattern. The photodetector (30) detects radiation attributed to hot electrons produced by the input signal supplied to the circuit (12), and converts it into an electric signal. The decision circuit (40) determines whether the circuit (12) has any defect based on the pulse width of the converted electric signal. Specifically, a pulse-width measurement circuit (50) determines whether the pulse width of the electric signal exceeded a predetermined width, and a detector (60) detects a defect of the circuit (12) based on the output from the pulse width measurement circuit (50). The detector (60) judges that a circuit (12) is defective if the pulse width of the electric signal of abnormal current in the circuit (12) is long.</p> |
