发明名称 METHOD AND APPARATUS FOR MEASUREMENT, AND METHOD AND APPARATUS FOR EXPOSURE
摘要 Any substance in predetermined gas is measured efficiently, quickly and accurately. An exposure device (S) comprises measurement part (M) for measuring a light-absorbing substance, a gas supply device (N) for supplying gas (GS) in the optical path space (LS) to the measurement part (M), a gas supply device (H) for supplying the measurement part (M) with clean gas (GT2) including a reduced amount of the light-absorbing substance, and a switch device (B) for alternately supplying the gas (GS) and the clean gas (GT2) to the measurement part (M). The concentration of the light-absorbing substance in the gas (GS) is measured accurately with a reduced amount of the light-absorbing substance remaining in the measurement part (M).
申请公布号 WO0181907(A1) 申请公布日期 2001.11.01
申请号 WO2001JP02633 申请日期 2001.03.29
申请人 NIKON CORPORATION;NAGASAKA, HIROYUKI;AOKI, TAKASHI 发明人 NAGASAKA, HIROYUKI;AOKI, TAKASHI
分类号 G01N21/35;G03F7/20;(IPC1-7):G01N27/409;G01N27/26;H01L21/027 主分类号 G01N21/35
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