发明名称 Low dielectric constant insulating film resin composition, method of forming low dielectric constant insulating film, and method of producing semiconductor device
摘要 A low dielectric constant insulating film resin composition for a semiconductor device, comprising a polyaryl ether-based low dielectric constant insulating film material and an antioxidant, a method of forming a low dielectric constant insulating film for a semiconductor device including the steps of coating and drying the above resin composition on the surface of a substrate, and a method of producing a semiconductor device provided with the above low dielectric constant insulating film, effectively suppressing the generation of carbon dioxide or carbon monoxide due to an oxidation reaction when forming an low dielectric constant insulating film for a semiconductor device using a polyaryl ether-based low dielectric constant material.
申请公布号 US2001036689(A1) 申请公布日期 2001.11.01
申请号 US20010875818 申请日期 2001.06.06
申请人 MUROYAMA MASAKAZU 发明人 MUROYAMA MASAKAZU
分类号 H01L21/31;C08L67/03;C08L71/00;C08L71/10;C08L71/12;C08L81/06;C09D5/25;H01B3/42;H01L21/312;(IPC1-7):H01L21/00 主分类号 H01L21/31
代理机构 代理人
主权项
地址