| 摘要 |
A system for testing inductive write head elements of a head stack assembly ("HSA"). A completed HSA is placed in a test apparatus. Test probes are aligned and placed in electrical contact with the head elements, preferably at a location between the head and the preamplifier. The HSA is then placed in a changing magnetic field. A low frequency magnetic field may be applied to test the head elements. The changing magnetic field induces electrical signals within the head elements. By analyzing these electrical signals, the condition and characteristics of the each head element can be determined.
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