| 摘要 |
An IC test device and method are provided which can display the results of a SHMOO plot accurately by performing decisions only for the necessary portions thereof, thus shortening the time required for performing data acquisition. A test point separation section groups the test points within the testing range for the SHMOO plot into blocks. A control section performs pass/fail decisions via a testing section for test points at the vertices of the blocks, and, from the patterns of decision results, picks out those blocks for which the test results for adjacent vertices are different, and picks out as complete testing blocks for which is to be tested at all the test points included in them, those blocks which have in common an edge region which includes vertices for which the test results differ. The testing section performs pass/fail decisions for all the test points within the complete testing blocks.
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