发明名称 Semiconductor device having stress reducing laminate and method for manufacturing the same
摘要 A semiconductor device having a stress reducing laminate and a method for manufacturing the same. Grooves are formed on the surface of a material layer selected from a multilayer structure of the semiconductor device, for example, a conductive layer. The cross sections of the grooves are semicircular or semi-elliptic. The stress applied to the conductive layer having the grooves is divided into a vertical component and a horizontal component with respect to the surface of the conductive layer. Accordingly, the stress applied vertically to the conductive layer is reduced, making it is possible to prevent the conductive layer from cracking due to stress and to reduce the stress transmitted to material layers under the conductive layer.
申请公布号 US2001035585(A1) 申请公布日期 2001.11.01
申请号 US20010893456 申请日期 2001.06.29
申请人 AHN JONG-HYON;LEE CHANG-HUN 发明人 AHN JONG-HYON;LEE CHANG-HUN
分类号 H01L21/28;H01L23/528;H05K1/02;H05K3/46;(IPC1-7):H01L23/48;H01L23/52 主分类号 H01L21/28
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