发明名称 APPEARANCE INSPECTING DEVICE AND ILLUMINATION METHOD IN APPEARANCE INSPECTION
摘要 PROBLEM TO BE SOLVED: To provide an appearance inspecting device and an illumination method in appearance inspection, ensuring inspection accuracy by appropriately calibrating the luminosity of a picked-up image. SOLUTION: In this illumination method in appearance inspection for illuminating an image picked-up object of the appearance inspection, the luminosity of a calibration image obtained by picking up the image of a calibration plate 3 by a camera 10 is detected by a luminosity detecting part 21, and a luminosity detection value is compared with a luminosity target value stored in a target value storage part 23 to obtain a correction value of a command value for commanding the luminosity of an illumination part 13, corresponding to an illumination value outputted from an illumination value output means 22. A corrected command value corrected by the correction value is outputted to an illumination control part 12 from a command part 25, and the illumination part 13 is lighted on the basis of the corrected command value. The luminosity of the image obtained by picking up the image can thereby be calibrated appropriately to ensure inspection accuracy in appearance inspection.
申请公布号 JP2001305066(A) 申请公布日期 2001.10.31
申请号 JP20000119002 申请日期 2000.04.20
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 YANO KEIJI
分类号 G01N21/84;(IPC1-7):G01N21/84 主分类号 G01N21/84
代理机构 代理人
主权项
地址