发明名称 SECONDARY TARGET DEVICE AND FLUORESCENT X-RAY ANALYSIS DEVICE
摘要 PROBLEM TO BE SOLVED: To hold an X-ray irradiation condition constant in the changeover of irradiation X-rays, to irradiate a sample with sufficient secondary X-rays and to irradiate the micro parts of the sample with the secondary X-rays. SOLUTION: This secondary target device is provided with a target body formed by arranging a plurality of target members provided with secondary target members at least at target faces opposed to a center axis formed of a straight line connecting an X-ray source to a sample irradiating position, radially with different distance from the center axis, and an X-ray impeding member disposed on the center axis to impede the irradiation of primary X-rays from the X-ray source to the sample irradiating position. The primary X-ray irradiates only the target face of a secondary target without passing through a clearance of the secondary target, and the secondary X-ray from the target face passes through the clearance of the secondary target and reaches the sample irradiating position.
申请公布号 JP2001305079(A) 申请公布日期 2001.10.31
申请号 JP20000120307 申请日期 2000.04.21
申请人 SHIMADZU CORP 发明人 KUWABARA SHOJI
分类号 G01N23/223;G01N23/20;G21K5/02;G21K5/08;(IPC1-7):G01N23/223 主分类号 G01N23/223
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