发明名称 THERMAL ANALYSIS DEVICE
摘要 PROBLEM TO BE SOLVED: To solve the problem of causing the fluctuation of temperature by the fluctuation of power supply quantity to a reference substance due to changing supplied power distribution according to temperature difference regarding the compensation of temperature difference between the sample side and the reference substance side by a differential thermal feedback loop and to solve the problem of causing mutual interference by the supply of power to both the sample side and reference substance side by double feedback loops. SOLUTION: A first solution means is so constituted that a differential thermal feedback loop changes power supplied to the sample side to compensate temperature difference generated between the sample side and the reference substance side and that an average temperature feedback loop controls power supplied to a reference substance side heater to make the temperature on the reference substance side coincide with program temperature and supplies the same amount of power to the sample side.
申请公布号 JP2001305086(A) 申请公布日期 2001.10.31
申请号 JP20000125442 申请日期 2000.04.26
申请人 SEIKO INSTRUMENTS INC 发明人 NAGASAWA JUN
分类号 G01N25/20;G01N25/48;(IPC1-7):G01N25/20 主分类号 G01N25/20
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