发明名称 |
APPARATUS AND METHOD FOR CHARACTERIZING LIBRARIES OF DIFFERENT MATERIALS USING X-RAY SCATTERING |
摘要 |
<p>An apparatus for characterizing a library containing an array of samples. The apparatus includes an x-ray beam directed at the library, a chamber housing the library and a beamline for directing the x-ray beam onto the library in the chamber. The chamber may include a translation stage that holds the library and that is programmable to change the position of the library relative to the x-ray beam and a controller that controls the movement of the translation stage to expose an element to the x-ray beam in order to rapidly characterize the element in the library. During the characterization, the x-ray beam diffracts upon impinging the element and a detector detects the diffracted x-ray beam in order to generate characterization data for the element.</p> |
申请公布号 |
EP1149282(A2) |
申请公布日期 |
2001.10.31 |
申请号 |
EP19990967404 |
申请日期 |
1999.12.17 |
申请人 |
SYMYX TECHNOLOGIES, INC. |
发明人 |
HAJDUK, DAMIAN;BENNETT, JAMES;JAIN, RAKESH |
分类号 |
B01J19/00;C40B40/18;G01N23/20;(IPC1-7):G01N23/20 |
主分类号 |
B01J19/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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