发明名称 METHOD FOR CLEANING SUBSTRATE TREATMENT APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a method for cleaning substrate treatment apparatuses to be free from foreign materials such as apparatuses for producing semiconductor, flat panel display, etc., and an inspection device, and the like. SOLUTION: In the method for cleaning substrate treatment apparatuses, a cleaning material of a heat resistant resin is carried into the apparatus and contacted with a place to be cleaned. Especially, the glass transition temperature of the heat resistant resin is at least 150 deg.C.
申请公布号 JP2001300436(A) 申请公布日期 2001.10.30
申请号 JP20000129498 申请日期 2000.04.28
申请人 NITTO DENKO CORP 发明人 TERADA YOSHIO;NAMIKAWA AKIRA
分类号 B08B1/02;B08B3/08;H05K3/00;(IPC1-7):B08B1/02 主分类号 B08B1/02
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