发明名称 Reconfigurable test system
摘要 A reconfigurable test system including a host computer coupled to a reconfigurable test instrument. The reconfigurable test instrument includes reconfigurable hardware-i.e. a reconfigurable hardware module with one or more programmable elements such as Field Programmable Gate Arrays for realizing an arbitrary hardware architecture and a reconfigurable front end with programmable transceivers for interfacing with any desired physical medium-and optionally, an embedded processor. A user specifies system features with a software configuration utility which directs a component selector to select a set of software modules and hardware configuration files from a series of libraries. The modules are embedded in a host software driver or downloaded for execution on the embedded CPU. The configuration files are downloaded to the reconfigurable hardware. The entire selection process is performed in real-time and can be changed whenever the user deems necessary. Alternatively, the user may create a graphical program in a graphical programming environment and compile the program into various software modules and configuration files for host execution, embedded processor execution, or programming the reconfigurable hardware.
申请公布号 US6311149(B1) 申请公布日期 2001.10.30
申请号 US19990229695 申请日期 1999.01.13
申请人 NATIONAL INSTRUMENTS CORPORATION 发明人 RYAN ARTHUR;ANDRADE HUGO;ODOM BRIAN KEITH
分类号 G06F11/273;G06F17/50;(IPC1-7):G06F9/44;G06F13/10;G06F13/12;G06F9/455 主分类号 G06F11/273
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