发明名称 TUNGSTEN SPUTTERING TARGET AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a high-density, low-cost tungsten sputtering target capable of reducing the occurrence of particles at the time of sputtering and also capable of depositing a sputter film having low resistivity, and its manufacturing method. SOLUTION: The tungsten sputtering target has 5-100 ppm molybdenum(Mo) content. It is more desirable to regulate the above Mo content to 10-50 ppm. Further, it is more desirable to regulate the contents of carbon(C) and oxygen(O) to <=100 ppm respectively.
申请公布号 JP2001295036(A) 申请公布日期 2001.10.26
申请号 JP20000115395 申请日期 2000.04.17
申请人 TOSHIBA CORP 发明人 AOYAMA HITOSHI;WATANABE TAKASHI;KOSAKA YASUO;ISHIGAMI TAKASHI;SUZUKI YUKINOBU
分类号 B22F9/04;B22F3/10;B22F3/14;C22C1/04;C22C27/04;C23C14/34;H01L21/203;H01L21/28;H01L21/285;H01L21/3205;H01L23/52;(IPC1-7):C23C14/34;H01L21/320 主分类号 B22F9/04
代理机构 代理人
主权项
地址
您可能感兴趣的专利