发明名称 |
TUNGSTEN SPUTTERING TARGET AND ITS MANUFACTURING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a high-density, low-cost tungsten sputtering target capable of reducing the occurrence of particles at the time of sputtering and also capable of depositing a sputter film having low resistivity, and its manufacturing method. SOLUTION: The tungsten sputtering target has 5-100 ppm molybdenum(Mo) content. It is more desirable to regulate the above Mo content to 10-50 ppm. Further, it is more desirable to regulate the contents of carbon(C) and oxygen(O) to <=100 ppm respectively.
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申请公布号 |
JP2001295036(A) |
申请公布日期 |
2001.10.26 |
申请号 |
JP20000115395 |
申请日期 |
2000.04.17 |
申请人 |
TOSHIBA CORP |
发明人 |
AOYAMA HITOSHI;WATANABE TAKASHI;KOSAKA YASUO;ISHIGAMI TAKASHI;SUZUKI YUKINOBU |
分类号 |
B22F9/04;B22F3/10;B22F3/14;C22C1/04;C22C27/04;C23C14/34;H01L21/203;H01L21/28;H01L21/285;H01L21/3205;H01L23/52;(IPC1-7):C23C14/34;H01L21/320 |
主分类号 |
B22F9/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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