发明名称 PRINTED MATTER INSPECTING METHOD AND DEVICE
摘要 PROBLEM TO BE SOLVED: To easily and surely inspect a dot-like defect articulately existent on an inspection image, which is obtained by picking up the image of printed matter, together with a picture. SOLUTION: The printed matter inspecting device is provided with an edge image generating circuit 34 for preparing respective edge images by extracting the edges of picture from respective R, G and B inspection images, a threshold generating circuit 36 for preparing a threshold image for making an edge part in the picture of the edge image from each of respective R, G and B reference images, a maximum RGB value selecting circuit 40 for preparing one composite threshold image with a maximum value as a pixel value of a relevant pixel by finding the maximum value from the luminance values of respective correspondent pixels concerning the respective R, G and B threshold images, a mask circuit 42 for preparing respective R, G and B masked edge images by making the respective R, G and B edge images with the composite threshold image, and means 44-48 for detecting a print defect on the basis of the respective masked edge images.
申请公布号 JP2001297321(A) 申请公布日期 2001.10.26
申请号 JP20000113405 申请日期 2000.04.14
申请人 DAINIPPON PRINTING CO LTD;OMRON CORP 发明人 ABE YOSHITO;SATO HIROSHI;SAKATA HIDETO;WATANABE KAZUAKI
分类号 B41F33/14;G01N21/892;G06T1/00 主分类号 B41F33/14
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