METHOD FOR DETECTING DEFECTS OF ACTIVE MATRIX SUBSTRATE OR ACTIVE MATRIX LIQUID CRYSTAL PANEL, AND DEFECT DETECTION DEVICE

摘要

PROBLEM TO BE SOLVED: To detect an existing defect on a substrate or a panel, a defect confirmed after a mounting process, or a possible future defect, and to correct them according to detected defect modes, in an active matrix substrate or an active matrix liquid crystal display panel. SOLUTION: Defects are detected by connecting connection terminals of an inspection device with the scanning lines and the signal lines of an active matrix substrate or the active matrix liquid crystal panel and by applying a several times higher voltage of a liquid crystal display device to the active matrix substrate or the active matrix liquid crystal panel. Then, correction is carried out according to the defect modes detected. This invention is applicable to an active matrix substrate or an active matrix liquid crystal panel having a Cs-on-Gate structure, a Cs-on-Common structure, and an auxiliary wiring structure.