| 发明名称 |
METHOD AND APPARATUS FOR TESTING MULTI-PORTED MEMORY |
| 摘要 |
PROBLEM TO BE SOLVED: To provide a method and an apparatus for testing a multi-ported memory especially when one or a plurality of ports thereof are not directly accessible, without using any intermediate logic circuit. SOLUTION: In this method and this system, multi-ported memory is separated into at least two parts used for testing one or a plurality of ports which is not directly accessible.
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| 申请公布号 |
JP2001296337(A) |
申请公布日期 |
2001.10.26 |
| 申请号 |
JP20010048744 |
申请日期 |
2001.02.23 |
| 申请人 |
INTERNATL BUSINESS MACH CORP <IBM> |
发明人 |
DEAN ADAMUS;THOMAS J EKKENROODO;STEVEN L GREGORE;KAMURAN ZARINE |
| 分类号 |
G01R31/28;G01R31/3183;G06F12/16;G11C29/52;G11C29/56;(IPC1-7):G01R31/28;G01R31/318;G11C29/00 |
主分类号 |
G01R31/28 |
| 代理机构 |
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