发明名称 Silicon with structured oxygen doping, its production and use
摘要 <p>Silicon and a process for producing silicon having a total oxygen content of 8x1017 atoms/cm3 to 1x1019 atoms/cm3 and a dislocation density of 1x105 cm-2 to 5x107 cm-2. The silicon has at least 25% of the oxygen contained in the form of silicon/oxygen precipitations that are concentrated in the area of the grain boundaries and dislocations. The process involves molten silicon being in contact with silicon monoxide and/or silicon dioxide therefore becoming saturated with oxygen, and/or the molten silicon is treated with an oxygen-containing gas before or during the crystallization. The dislocation density is set by means of the cooling rate of the silicon. The silicon finds use in film-casting or film drawing processes and in photovoltaics.</p>
申请公布号 NZ505167(A) 申请公布日期 2001.10.26
申请号 NZ20000505167 申请日期 2000.06.14
申请人 BAYER AKTIENGESELLSCHAFT 发明人 HABLER, CHRISTIAN;HOFS, HANS-ULRICH;KOCH, WOLFGANG;THURM, SIEGFRIED;BREITENSTEIN, OTWIN
分类号 C01B33/02;C30B15/00;C30B15/34;C30B29/16;C30B29/64;H01L21/208;H01L31/04;(IPC1-7):C07F7/02;H01L31/028;H01L31/042 主分类号 C01B33/02
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