发明名称 PROBE UNIT AND MEASURING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a probe unit or the like which can prevent the breakdown of a measuring device due to static electricity charged on a circuit board. SOLUTION: The probe unit comprises a pair of pins 1a and 1b which come into contact with circuit interconnections 101 on the circuit board 100. A switch 1d which short-circuits the pins 1a and 1b so as to be electrically separable is installed. In a moment in which the pins 1a and 1b are brought into contact with the circuit interconnections 101, the switch 1d is closed, and the pins 1a and 1b are short-circuited. Thereby, the static electricity is made to escape to a GND, and the switch 1d is then opened so as to take a measurement.
申请公布号 JP2001296320(A) 申请公布日期 2001.10.26
申请号 JP20000114085 申请日期 2000.04.14
申请人 OHT INC 发明人 ISHIOKA SEIGO;YAMAOKA HIDEJI
分类号 G01R1/073;G01R1/067;G01R1/36;G01R27/02;(IPC1-7):G01R27/02 主分类号 G01R1/073
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