发明名称 METHOD OF EXPOSURE AND ALIGNER
摘要 PROBLEM TO BE SOLVED: To obtain a method of exposure and an aligner by which a high- resolution pattern can be formed in an arbitrary shape by double exposure consisting of exposure of periodic patterns and normal pattern exposure. SOLUTION: Several mask patterns having different patterns are composed by an optical composition member and the same region on a wafer surface is scanned and exposed through the several mask patterns in sequence or simultaneously and in the same way by a projection optical system with synchronism between the several mask patterns and the wafer.
申请公布号 JP2001297976(A) 申请公布日期 2001.10.26
申请号 JP20000114725 申请日期 2000.04.17
申请人 CANON INC 发明人 INOUE MITSURU
分类号 G03F7/22;G03F7/20;H01L21/027;(IPC1-7):H01L21/027 主分类号 G03F7/22
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