发明名称 |
COAXIAL-TYPE CONTACT PROBE |
摘要 |
PROBLEM TO BE SOLVED: To provide a coaxial-type contact probe capable of accurately performing TDR measurements even on a printed circuit board of a short pattern length. SOLUTION: The coaxial-type contact probe 1 is constituted of both a probe body 7 made of a rigid cable and a contact part 2 made of a rubber material mounted to the tip of the probe body 7. The contact part 2 is formed in a thin disk shape of the approximately same diameter as the probe body 7. The inner conductor 3 and outer conductor 5 of the contact part 2 have conductivity so as to constitute coaxial lines in the thickness direction, and the layer 6 between the inner conductor 3 and outer conductor 5 has an insulating property. By bringing a probe tip into contact with a printed circuit board at the contact part 2 made of an elastic body, the reflection of incident signals at a contact point is reduced to enhance accuracy in TDR measurements.
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申请公布号 |
JP2001296314(A) |
申请公布日期 |
2001.10.26 |
申请号 |
JP20000113558 |
申请日期 |
2000.04.14 |
申请人 |
NIDEC-READ CORP |
发明人 |
NISHIKAWA HIDEO;YAMASHITA MUNEHIRO |
分类号 |
G01R1/067;G01R27/02;G01R27/04;G01R31/02;(IPC1-7):G01R1/067 |
主分类号 |
G01R1/067 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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