发明名称 INSPECTION STRUCTURE IN INTEGRATED SEMICONDUCTOR
摘要 PROBLEM TO BE SOLVED: To increase the number of individual structures or inspecting components that can inspect a chip surface of an integrated circuit. SOLUTION: The inspecting components are a plurality of transistors. At least two transistors are placed between two adjacent contact surfaces and are connected to the adjacent contact surfaces. Thus, voltage can be applied to the transistors via the contact surfaces, and gate terminals of the transistors are connected to another contact surface to supply switching current.
申请公布号 JP2001298062(A) 申请公布日期 2001.10.26
申请号 JP20010047190 申请日期 2001.02.22
申请人 INFINEON TECHNOLOGIES AG 发明人 RICHTER FRANK
分类号 G01R31/26;H01L21/66;H01L23/544;(IPC1-7):H01L21/66 主分类号 G01R31/26
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