发明名称 |
CRYSTALLINE SILICON THIN FILM |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide a crystalline silicon thin film which is uniformly formed extending over its large area and is high in quality while a low-cost glass substrate is used for forming the thin film. SOLUTION: This crystalline silicon thin film is a crystalline silicon thin film formed on a transparent oxide conducting layer formed on a glass substrate utilizing a vapor phase deposition and the thin film is characterized in that a majority of crystal grains contained in the thin film are orientated in such a way as to have a crystallographic face (110) in almost parallel to the surface of the thin film and the ratio of (220)/(111) which is represented as the ratio of a diffraction intensity to a diffraction intensity from a crystallographic face (220) and a crystallographic face (111) in an X-ray diffraction due to the film is 1 to 100 or more.</p> |
申请公布号 |
JP2001297992(A) |
申请公布日期 |
2001.10.26 |
申请号 |
JP20010058839 |
申请日期 |
2001.03.02 |
申请人 |
KANEGAFUCHI CHEM IND CO LTD |
发明人 |
YAMAMOTO KENJI;OKAMOTO KEIJI |
分类号 |
C23C16/24;H01L21/205;H01L31/04;(IPC1-7):H01L21/205 |
主分类号 |
C23C16/24 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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