发明名称 ELECTRON BEAM IRRADIATION DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To provide an electron beam irradiation device that can scan an electron beam uniformly by avoiding problems of the hysteresis properties of a scanning coil when the electron beam is scanned reciprocally in the longitudinal direction. SOLUTION: The electron beam irradiation device which scans the electron beam in the first direction by using a power source generating a triangular wave to supply a triangular-wave current to the scanning coil and does so in the direction orthogonal to the first direction by using a power source generating a square wave to supply a square-wave current to a deflection coil is equipped with a controlling device that deforms the waveform of the triangular wave supplied from the power source generating it so as to cancel the effect of the hysteresis properties of the scanning coil.</p>
申请公布号 JP2001296397(A) 申请公布日期 2001.10.26
申请号 JP20000112588 申请日期 2000.04.13
申请人 EBARA CORP 发明人 KOGA MASAHIRO;NAKAMURA ATSUSHI
分类号 G21K5/00;B01D53/60;B01D53/74;G21K1/087;G21K5/04;(IPC1-7):G21K5/00 主分类号 G21K5/00
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