发明名称 CMP UNIFORMITY
摘要 Improved CMP uniformity is achieved by providing improved control of the slurry distribution. Improved slurry distribution is achieved by, for example, the use of a slurry dispenser that dispenses slurry from a plurality of dispensing points. Providing a squeeze bar between the slurry dispenser and wafer to redistribute the slurry also improves the slurry distribution.
申请公布号 US2001034134(A1) 申请公布日期 2001.10.25
申请号 US19990271684 申请日期 1999.03.18
申请人 LIN CHENTING;VAN DEN BERG ROBERT;PANDEY SUMIT 发明人 LIN CHENTING;VAN DEN BERG ROBERT;PANDEY SUMIT
分类号 B24B37/04;B24B57/02;H01L21/302;H01L21/304;(IPC1-7):H01L21/302;C23F1/02;H01L21/461 主分类号 B24B37/04
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