发明名称 Gas cluster ion beam low mass ion filter
摘要 Incorporating the use of a permanent magnet within a GCIB apparatus to separate undesirable monomer ions from a gas cluster ion beam to facilitate improved processing of workpieces. In an alternate embodiment, the effect of the permanent magnet may be controlled by the use of an electrical coil. The above system eliminates problems related to power consumption and heat generation.
申请公布号 US2001033128(A1) 申请公布日期 2001.10.25
申请号 US20000727810 申请日期 2000.12.01
申请人 TORTI RICHARD P.;DYKSTRA JERALD P. 发明人 TORTI RICHARD P.;DYKSTRA JERALD P.
分类号 H01J37/05;H01J37/305;H01J49/04;H05H7/04;(IPC1-7):H05H1/00 主分类号 H01J37/05
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