IMPROVED BURN-IN TEST MODE ENTRY APPARATUS OF SEMICONDUCTOR DEVICE

摘要

PURPOSE: An improved burn-in test mode entry apparatus of a semiconductor device is provided to prevent an entry process of a burn-in test mode in a unstable state by sensing a substrate bias voltage level. CONSTITUTION: A substrate bias voltage level detection portion(110) is used for comparing a substrate bias voltage level branched from a substrate bias voltage generator with a reference voltage level and outputting a disable signal according to the compared result. A switching portion(120) is switched by the disable signal of the substrate bias voltage level detection portion(110). A burn-in test mode detection portion(130) is used for detecting an external control signal and outputting a burn-in test mode enable signal. A burn-in test mode drive portion(140) is used for driving a burn-in test mode according to the burn-in test mode enable signal of the burn-in test mode detection portion(130).