发明名称 METHOD FOR MANUFACTURING FERROELECTRIC IN SEMICONDUCTOR MEMORY DEVICE
摘要 PURPOSE: A method for manufacturing a ferroelectric in a semiconductor memory device is provided to increase lifetime of FeRAM cells by removing fatigue of a reference cell. CONSTITUTION: In a semiconductor memory device comprising a plurality of ferroelectric memory cells(40) and reference cells, a ferroelectric is fabricated by the following steps. Zirconium n-butoxide and titanium iso-propoxide are melted in 2-methyl oxythenol. The 2-methyl oxythenol is treated by chelating. Lanthanum iso-proxide is added in the sample. After refluxing the sample, Pb acetate trihydrate is added. The sample is stirred using nitric acid as catalyst, spin-coated and annealed, thereby forming the ferroelectric.
申请公布号 KR100313932(B1) 申请公布日期 2001.10.25
申请号 KR19970049216 申请日期 1997.09.26
申请人 HYUNDAI MICRO ELECTRONICS CO., LTD. 发明人 YANG, DU YEONG
分类号 G11C14/00;G11C11/22;H01L21/822;H01L21/8242;H01L21/8246;H01L27/04;H01L27/10;H01L27/105;H01L27/108;(IPC1-7):H01L27/10 主分类号 G11C14/00
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