发明名称 |
METHOD FOR MANUFACTURING FERROELECTRIC IN SEMICONDUCTOR MEMORY DEVICE |
摘要 |
PURPOSE: A method for manufacturing a ferroelectric in a semiconductor memory device is provided to increase lifetime of FeRAM cells by removing fatigue of a reference cell. CONSTITUTION: In a semiconductor memory device comprising a plurality of ferroelectric memory cells(40) and reference cells, a ferroelectric is fabricated by the following steps. Zirconium n-butoxide and titanium iso-propoxide are melted in 2-methyl oxythenol. The 2-methyl oxythenol is treated by chelating. Lanthanum iso-proxide is added in the sample. After refluxing the sample, Pb acetate trihydrate is added. The sample is stirred using nitric acid as catalyst, spin-coated and annealed, thereby forming the ferroelectric.
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申请公布号 |
KR100313932(B1) |
申请公布日期 |
2001.10.25 |
申请号 |
KR19970049216 |
申请日期 |
1997.09.26 |
申请人 |
HYUNDAI MICRO ELECTRONICS CO., LTD. |
发明人 |
YANG, DU YEONG |
分类号 |
G11C14/00;G11C11/22;H01L21/822;H01L21/8242;H01L21/8246;H01L27/04;H01L27/10;H01L27/105;H01L27/108;(IPC1-7):H01L27/10 |
主分类号 |
G11C14/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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