APPARATUS AND METHOD FOR TEST OF IC DEVICE

摘要

PURPOSE: To test an IC device quickly, efficiently and smoothly even when a large difference exists in the time for tests executed regarding individual IC devices. CONSTITUTION: The IC device D is placed on each socket 11 of a test board 4, and its electric characteristic is tested. The test of the IC device D by an IC tester T is performed respectively independently with reference to each socket 11. Whenever the test of the IC device D placed on each socket 11 is finished, a signal to drive a device transfer means 30 is output to a controller C from the IC tester T. The IC device D whose test is finished is taken out from the socket 11 by the device transfer means 30, and an IC device D to be tested newly is placed. That the IC device D to be tested newly is placed on the socket 11 is detected by an optical sensor 19 which is installed at each socket 11, and the IC device D placed on the socket 11 is tested.