发明名称 Low temperature polysilicon manufacturing process
摘要 A low temperature polysilicon manufacturing method. A system for performing physical vapor deposition is used to form an amorphous silicon film with micro-crystals therein. The amorphous silicon film is annealed at a temperature between 400° C. to 500° C. for about 6 to 16 hours to form a polysilicon film. The polysilicon film can be further processed into a low-temperature polysilicon film transistor.
申请公布号 US6306697(B1) 申请公布日期 2001.10.23
申请号 US20010755579 申请日期 2001.01.05
申请人 UNITED MICROELECTRONICS CORP. 发明人 CHANG TING-CHANG;PENG DU-ZEN;CHANG CHUN-YEN
分类号 H01L21/336;H01L29/786;(IPC1-7):H01L21/84 主分类号 H01L21/336
代理机构 代理人
主权项
地址