发明名称 X-ray examination apparatus including a diaphragm unit
摘要 The invention relates to an X-ray examination apparatus which includes an X-ray source and a diaphragm unit which is connected to the X-ray source and is provided with shutters for limiting a radiation cone beam emanating from the focal spot of the X-ray source, and also includes a light source for generating a light cone beam which traverses the shutters via a mirror. When the dimensions of the light-emitting parts of the light source are significantly larger than the focal spot, the irradiation field irradiated by the radiation cone beam is smaller than the illuminated field illuminated by the light cone beam. In order to match the irradiation field with the illuminated field, the shutters are provided with correction shutters which are transparent to X-rays but impervious to light and limit the light cone beam.
申请公布号 US6305842(B1) 申请公布日期 2001.10.23
申请号 US19990376858 申请日期 1999.08.18
申请人 U.S. PHILIPS CORPORATION 发明人 KUNERT HEINZ-PETER
分类号 A61B6/08;G03B42/02;(IPC1-7):G21K1/02 主分类号 A61B6/08
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