发明名称 |
Method for testing an electronic circuit |
摘要 |
A method for testing an electronic circuit is described, in which the actual state of circuit components which have previously been activated on a test basis after an initial initialization is compared with a setpoint state. Of the circuit components to be tested, essentially only those circuit components are operated simultaneously which, under the given circumstances, can be expected to interact in the context.
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申请公布号 |
US6308291(B1) |
申请公布日期 |
2001.10.23 |
申请号 |
US19980156442 |
申请日期 |
1998.09.18 |
申请人 |
SIEMENS AKTIENGESELLSCHAFT AG |
发明人 |
KOCK ERNST-JOSEF;SCHNEIDER PETER |
分类号 |
G01R31/28;G01R31/3185;(IPC1-7):G01R31/28 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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