发明名称 METHOD FOR TESTING TRAFFIC PATH BETWEEN MSC AND BSC OF MOBILE COMMUNICATION SYSTEM
摘要 PURPOSE: A method for testing a traffic path between an MSC(Mobile Switching Center) and a BSC(Base Transceiver Subsystem) of a mobile communication system is provided to save a maintenance time and cost by comparing a test sound transmitted to the BSC with a test sound received from the BSC, testing the traffic path between the MSC and the BSC, and testing each hardware device in a vocoder and the BSC. CONSTITUTION: If a test is not operated in a CCP(Call Control Processor) of a BSC(S4), an operator inputs test instructions for testing a traffic path between an MSC and the BSC and each hardware device in a vocoder and the BSC to the CCP through a BSM(Base Station Manager)(S5). The CCP groups transmitting and receiving paths of each hardware device according to 4 test modes to perform a loop-back(S6) and transmits the test instructions to the MSC(S7). The MSC receives the test instructions and transmits a test sound having a level and frequency requested by the operator through a test equipment to the BSC(S8). The test equipment measures the level and frequency of a received test sound when the transmitted test sound is received according to the 4 test modes and transmits the measured level of frequency together with the level and frequency of the test sound transmitted to the BSC to the CCP(S9). The CCP judges whether the number of test requested by the operator is performed(S10). If the number of test requested by the operator is performed, the CCP compares the level and frequency of the transmitted test sound with the level and frequency of the received test sound using a level threshold value and frequency threshold value requested by the operator and passes a good/bad judgement to the hardware device corresponding to each test mode(S11). The CCP transmits the judgement result to the BSM and outputs the judgement result to the operator(S12).
申请公布号 KR20010091090(A) 申请公布日期 2001.10.23
申请号 KR20000012439 申请日期 2000.03.13
申请人 HYNIX SEMICONDUCTOR INC. 发明人 JUNG, JAE YONG;LIM, YEONG IL;SUL, MYEONG GI
分类号 H04B17/00;(IPC1-7):H04B17/00 主分类号 H04B17/00
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